Zobrazeno 1 - 7
of 7
pro vyhledávání: '"A. J. Patrinos"'
Publikováno v:
Physical Review B. 52:9291-9299
Sixteen [001] twist boundaries in ${\mathrm{Cu}}_{3}$Au spanning a wide range of misorientation angles are investigated at T=0 K using the molecular dynamics and Monte Carlo techniques within the framework of the coincident site lattice approach. Gra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a42783d9cee547fe186643ed4bab123
https://doi.org/10.1103/physrevb.52.9291
https://doi.org/10.1103/physrevb.52.9291
Autor:
J. A. Schwarz, A. J. Patrinos
Publikováno v:
Journal of Applied Physics. 75:7292-7298
A two‐dimensional computer simulation of electromigration based on resistor networks is presented. The model utilizes a realistic grain structure generated by the Monte Carlo method and takes specific account of the local effects through which elec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f73933ede0fc0b02b7919652cb08c40
https://doi.org/10.1063/1.356664
https://doi.org/10.1063/1.356664
Hemoglobin (Hb) disorders are common, potentially lethal monogenic diseases, posing a global health challenge. With worldwide migration and intermixing of carriers, demanding flexible health planning and patient care, hemoglobinopathies may serve as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2127::3c311f5fae43e2e39eb286a96b06c8ce
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3090195
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3090195
Publikováno v:
Journal of The Electrochemical Society. 138:2774-2778
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e22900f093e55e8a6445459ab35a989f
https://doi.org/10.1149/1.2086053
https://doi.org/10.1149/1.2086053
Publikováno v:
Journal of Applied Physics. 70:1561-1564
1/f noise measurements have been performed on Al‐Cu thin films, of varying grain size, which were also subjected to electromigration lifetime tests. The results indicate a strong grain size dependence of the 1/f noise magnitude in the films. Moreov
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4678ff7c99652c47c1a52da5cc6166dc
https://doi.org/10.1063/1.349545
https://doi.org/10.1063/1.349545
Publikováno v:
Vacuum. 41:1434-1436
An in situ transmission electron microscopy (TEM) method has been devised for the measurement of electrical resistance as a function of temperature and/or time for thin film stripes. A custom TEM sample holder was fabricated through which up to eight
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c42a75410342319f059e7a1b0b3afbb4
https://doi.org/10.1016/0042-207x(90)93981-n
https://doi.org/10.1016/0042-207x(90)93981-n
Publikováno v:
Vacuum. 41:1229-1230
A resistometric method has been developed to measure electromigration kinetic parameters under high current stress conditions in a short time. In this technique, the resistance R and the temperature increase ΔT of thin film stripes are measured simu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22e7a3ac9b5111d53658002c46f5268d
https://doi.org/10.1016/0042-207x(90)93918-9
https://doi.org/10.1016/0042-207x(90)93918-9