Zobrazeno 1 - 10
of 21
pro vyhledávání: '"A. J. M. Berntsen"'
Autor:
Arjan J. M. Berntsen, Coen T. H. F. Liedenbaum, H.F.M. Schoo, P. van de Weijer, Paul W. M. Blom, Y. Croonen
Publikováno v:
Journal of Materials Science: Materials in Electronics. 11:105-109
The operation characteristics of polymer light-emitting diodes (PLEDs) are strongly dependent on materials, processing and the structure of the device. The device structure developed at Philips Research is presented together with some typical results
Autor:
Jeroen J. M. Vleggaar, Arjan J. M. Berntsen, H.F.M. Schoo, P. van de Weijer, Richard E. Gill, Coen T. H. F. Liedenbaum, Robert-Jan Visser
Publikováno v:
Optical Materials. 12:183-187
In order to exploit the extensive potential of polymer light-emitting diodes in commercial applications a number of lifetime specifications have to be met. In this paper we report on the performance and stability of polymer light-emitting diodes base
Autor:
H.F.M. Schoo, Jeroen J. M. Vleggaar, Coen T. H. F. Liedenbaum, Y. Croonen, Robert-Jan Visser, Peter van de Weijer, Arjan J. M. Berntsen
Publikováno v:
Optical Materials. 9:125-133
Polymer LEDs have a number of attractive properties that make them suitable for many applications. Operating at low voltage, bright large-area devices can be made by simple technology. One of the limitations that prohibited industrialization of polym
Autor:
Arjan J. M. Berntsen, Jeroen J. M. Vleggaar, P. van de Weijer, Coen T. H. F. Liedenbaum, Y. Croonen
Publikováno v:
Philips Journal of Research. 51:511-525
In this paper, we report on the lifetime of polymer LEDs fabricated at Philips Research. For single-layer LEDS, we find that the operational lifetime in nitrogen gas is limited by the stability of the indium-tin-oxide (ITO) anode. By using a polymeri
Publikováno v:
Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences. 355:695-706
In this paper we describe a quantitative approach to the photochemical degradation of a soluble dialkoxy–PPV that was also used to make polymer light–emitting diodes. We have defined a quantum yield for degradation (γ) and investigated the depen
Publikováno v:
Materials Chemistry and Physics. 46:140-146
We describe the effects of implantation of silicon into pure amorphous silicon and hydrogenated amorphous silicon and of erbium into soda-lime silicate glass and hydrogenated amorphous silicon. The former implantations and subsequent annealing treatm
Publikováno v:
Journal of Applied Physics. 78:1964-1967
Hydrogenated amorphous silicon (a‐Si:H) films were grown in an rf‐plasma deposition system on various substrates. The thickness of the films ranged from 11 to 579 nm. The structural properties of the films were studied by means of ex situ Raman s
Autor:
J.Th.M. De Hosson, Rudi A. Hakvoort, Marcel J. W. Greuter, A. van Veen, A. J. M. Berntsen, L. Niesen, Marc Verwerft, Willem G. Sloof
Publikováno v:
Journal of Applied Physics, 77(7), 3467-3478. AMER INST PHYSICS
Amorphous Si layers were grown by krypton plasma sputter deposition at 310 °C. By pulsation of the substrate potential between 0 and 50 eV, the Kr concentration in the layers could be varied to a maximum of 5.5 at. %. A model which describes trappin
Autor:
W.G.J.H.M. van Sark, W. F. van der Weg, A. J. M. Berntsen, H. Herremans, J. Bezemer, R.A.C.M.M. van Swaaij
Publikováno v:
Journal of Applied Physics. 76:251-256
Infrared spectra of a‐Si1−xCx:H deposited in a glow discharge of a silane/methane mixture have been measured. Comparison with elastic recoil detection and Rutherford backscattering spectrometry shows that the mean number of hydrogen atoms attache
Contribution of defects to electronic, structural, and thermodynamic properties of amorphous silicon
Autor:
Peter Stolk, A. J. M. Berntsen, W. F. van der Weg, Gerhard Müller, G. Krötz, F.W. Saris, R.C. Barklie, L. Sealy
Publikováno v:
Journal of Applied Physics. 75:7266-7286
The structure of pure, nonhydrogenated amorphous silicon (a‐Si) was modified by means of ion implantation, furnace annealing, and pulsed laser annealing. Defects in a‐Si were probed by measuring the photocarrier lifetime τ at low carrier densiti