Zobrazeno 1 - 10
of 12
pro vyhledávání: '"A. G. Goryachev"'
Publikováno v:
Modern Electronic Materials, Vol 2, Iss 4, Pp 131-137 (2016)
MOCVD grown AlGaN/GaN heterostructures on sapphire and silicon substrates have been studied. The capacity–voltage characteristic have been measured in the 200 Hz–1 MHz frequency range with a planar position of mercury and second probe on the spec
Externí odkaz:
https://doaj.org/article/3506fef9bf724bfa98f214b73f14ab3c
Informational Model for Calculating Road Surface Life and Repairs and the Rational Financing Thereof
Publikováno v:
2022 Intelligent Technologies and Electronic Devices in Vehicle and Road Transport Complex (TIRVED).
Publikováno v:
Russian Microelectronics. 46:591-599
AlGaN/GaN heterostructures and AlGaN/GaN/SiC HEMT-transistors’ Schottky barriers (SBs) are studied by the capacitance–voltage (CV) method and the SIMS method in order to determine the causes of the capacitance instability in some cases. It is sho
Autor:
N N Arous, M G Goryachev
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 1159:012033
Comparative design of structures allows at an early stage of project development to assess their behavior and predict service life. Approximate numerical methods, for example, the finite element method, are widely introduced to simulate the operation
Publikováno v:
Modern Electronic Materials, Vol 2, Iss 4, Pp 131-137 (2016)
MOCVD grown AlGaN/GaN heterostructures on sapphire and silicon substrates have been studied. The capacity–voltage characteristic have been measured in the 200 Hz–1 MHz frequency range with a planar position of mercury and second probe on the spec
Publikováno v:
Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering. 19:115-123
A complex of studies of the AlGaN/GaN heterostructures and the AlGaN/GaN/SiC HEMT-transistors Schottky barriers has been carried out by the C-V method and the SIMS method in order to determine the causes of the capacitance instability in some cases w
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 832:012037
The object of research is the method of calculating the strength of cement concrete airfield pavement. According to the current regulatory documents, the calculation of the strength of the coating is carried out according to the first limit state, ta
Publikováno v:
Russian Microelectronics. 44:537-545
The influence of the silicon epitaxial layer’s peculiarities and the silicon–sapphire interface in the silicon-on-sapphire (SOS) structure on the capacitance parameters of MIS-structures formed on SOS with submicron layers of silicon has been stu
Publikováno v:
Journal of Experimental and Theoretical Physics. 91:353-360
A microscopic t-J-I model with competing antiferromagnetic (J) and ferromagnetic (I) exchange interactions is proposed for strongly correlated electrons in RuSr2GdCu2O8. It is assumed that for CuO2 layers and for RuO2 layers. A superconducting soluti
Autor:
E. M. Temper, I. B. Gulyaev, A. U. Dorofeev, N. B. Gladisheva, K. L. Enisherlova, V. G. Goryachev
Publikováno v:
SPIE Proceedings.
Nondestructive diagnostic method was developed for epitaxial heterostructure quality prediction. Such prediction is very important for production of some types HF FETs. The various heterostructure modifications grown on sapphire substrates have been