Zobrazeno 1 - 10 of 17 pro vyhledávání: '"A. F.J. Hill"'
2
Three decades of HDLs. I. CDL through TI-HDL
Autor: Y. Chu, F.J. Hill, D.L. Dietmeyer, B. Johnson, G. Ordy, C.W. Rose, M. Roberts, J.R. Duley, M.R. Barbacci
Publikováno v: IEEE Design & Test of Computers. 9:69-81
Current hardware description languages (HDLs) benefit from the efforts of designers of hardware description languages dating back to the mid 1960s. The developers of six HDLs discuss their motivations and their views of how their work relates to the
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a161315ae326bccf3e55cf23e36108aa
https://doi.org/10.1109/54.143147
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3
A sequential circuit fault simulation by surrogate fault propagation
Autor: F.J. Hill, X. Wang, Z. Mi
Publikováno v: ITC
A novel technique for synchronous fault simulation of sequential circuits utilizing surrogate fault propagation and backward fault collection is introduced, and its implementation is evaluated. Fault effects which reconverge over time are simulated a
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::37b77a97f0b31e9d5bb2fb28fe855d11
https://doi.org/10.1109/test.1989.82272
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5
A repeated criterion-based audit of radiographic usage by a paediatric dentistry unit
Autor: F.J. Hill, R.R. Shockledge
Publikováno v: International journal of paediatric dentistry. 8(4)
Aims. To report a simple clinical audit which was conducted within a single hospital paediatric dental unit and to demonstrate the potential value of such small-scale projects. Design. A criterion-based audit of radiographic practice which was repeat
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::80627f23ab6c44acda12574edc85203f
https://pubmed.ncbi.nlm.nih.gov/9927928
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6
A vector based backward state justification search for test generation in sequential circuits
Autor: M.D.G. Karunaratne, F.J. Hill
Publikováno v: Ninth Annual International Phoenix Conference on Computers and Communications. 1990 Conference Proceedings.
An innovative approach to the state justification portion of the sequential circuit automatic test pattern generation (ATPG) process is described. Given the absence of a stored fault, an ATPG controller invokes some combinational circuit test generat
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3a74f1e0d830e8c06b88d3079508d7fd
https://doi.org/10.1109/pccc.1990.101679
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7
Enamel fluoride uptake affected by site of application: comparing sodium and amine fluorides
Autor: H.N. Newman, F.J. Hill, Y. Mok
Publikováno v: Caries research. 24(1)
In enamel fluoride uptake studies, the most frequently sampled site is the middle third of the buccal surface. Because different parts of the enamel surface vary in fluoride concentration, the present study investigated fluoride uptake at contrasting
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2ddfd5d6927046f68d8d4abdc3175cc6
https://pubmed.ncbi.nlm.nih.gov/2293886
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8
Test generation based on dynamic search space reductions
Autor: M. Karunaratne, F. Dong, F.J. Hill, X. Wang
Publikováno v: Scopus-Elsevier
Techniques for selecting optimum sensitization paths in a logic circuit and for reducing backtrackings using a heuristic function in the form of a work load are described. The test generation algorithm, which has some resemblance to PODEM, reduces th
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::64823e88a716286d1895b2feff45d9d1
https://doi.org/10.1109/pccc.1990.101678
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