Zobrazeno 1 - 6
of 6
pro vyhledávání: '"A. Devin Giddings"'
Autor:
Peter Ramvall, A. Devin Giddings, Yee-Chia Yeo, Aryan Afzalian, Ruey-Lian Hwang, T. Vasen, Matthias Passlack
Publikováno v:
ACS Applied Nano Materials. 2:1253-1258
Growth of ultrathin semiconducting nanowires (NWs) and incorporation of dopants suitable for future CMOS scaling targets (diameter
Autor:
Yasuo Shimizu, Koji Inoue, Wilfried Vandervorst, Sebastian Koelling, Alexander Devin Giddings, Wai Kong Yeoh, Robert Estivill
Publikováno v:
Scripta Materialia, 148, 82-90. Elsevier
Advanced semiconductor devices offer a metrology challenge due to their small feature size, diverse composition and intricate structure. Atom probe tomography (APT) is an emerging technique that provides 3D compositional analysis at the atomic-scale;
Autor:
A. Devin Giddings, Yizhi Wu, Marcel A. Verheijen, Bart Macco, Fred Roozeboom, Wilhelmus M. M. Kessels, David J. Larson, Ty J. Prosa
Publikováno v:
Chemistry of Materials, 30(4), 1209-1217. American Chemical Society
Chemistry of Materials
Chemistry of Materials, 30, 1209−1217
Chemistry of Materials
Chemistry of Materials, 30, 1209−1217
The maximum conductivity achievable in Al-doped ZnO thin films prepared by atomic layer deposition (ALD) is limited by the low doping efficiency of Al. To better understand the limiting factors for the doping efficiency, the three-dimensional distrib
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c07bb45bb0aff959386c116c06e992b7
https://research.tue.nl/nl/publications/597a3478-8228-4f6e-aa15-51a6b22c5fda
https://research.tue.nl/nl/publications/597a3478-8228-4f6e-aa15-51a6b22c5fda
Publikováno v:
The Asia Journal of Applied Microbiology. 2:35-43
Present case study was carried out during 2013, to assess the microbiological quality of three freshwater fishes (Hoplosternum littorale, Cichlasoma bimaculatum and Hoplias malabaricus) offered for sale at two local markets in region 6. Fishes were e
Autor:
G. J. Hamhuis, Hiromi Yuasa, H. Fukuzawa, PM Paul Koenraad, Michiko Hara, Alexander Devin Giddings, JG Joris Keizer
Publikováno v:
Physical Review B: Condensed Matter, 83(20):205308, 205308-1/7. American Institute of Physics
This study compares cross-sectional scanning tunnelling microscopy (XSTM) and atom probe tomography (APT). We use epitaxially grown self-assembled InAs quantum dots (QDs) in GaAs as an exemplary material with which to compare these two nanostructural