Zobrazeno 1 - 4
of 4
pro vyhledávání: '"A. D. Yunik"'
Autor:
A. D. Yunik, J. A. Solovjov
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 8, Pp 14-20 (2023)
Effect of rapid thermal annealing conditions on the specific resistance of the ohmic contacts of Ti/Al/Ni/Au metallization with layer thicknesses of 20/120/40/40 nm to the GaN/AlGaN heterostructure with a two-dimensional electron gas on a sapphire su
Externí odkaz:
https://doaj.org/article/44d0a5572d064a3aad7af5625fd28834
Autor:
A. D. Yunik, A. H. Shydlouski
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 7, Pp 12-19 (2022)
Regularities of the reflected signal intensity changing in time, recorded by the detector of the laser interferometer with the operating frequency of 670 nm during the inductively coupled plasma reactive ion etching in a Cl2/N2/O2 atmosphere of GaN,
Externí odkaz:
https://doaj.org/article/ebe682b2eee348aabebf9fee41e6590f
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 3, Pp 13-19 (2022)
Effect of rapid thermal annealing temperature on the electrophysical properties of the ohmic contact of Ti/Al/Ni metallization with layer thicknesses of 20/120/40 nm to the GaN/AlGaN heterostructure with a two-dimensional electron gas on a sapphire s
Externí odkaz:
https://doaj.org/article/45fe69ca206b455882d47aeeacb3f1c0
Publikováno v:
Doklady BGUIR. 20:13-19