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pro vyhledávání: '"A. Ben Kabaar"'
Autor:
O. Dezellus, Laurent Gremillard, A. Ben Kabaar, Cyril Buttay, Anthony Gravouil, Rafael Estevez
Publikováno v:
Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2017, ⟨10.1016/j.microrel.2017.06.001⟩
Microelectronics Reliability, Elsevier, 2017, ⟨10.1016/j.microrel.2017.06.001⟩
International audience; Direct Bonded Copper (DBC) are produced by high temperature (>1000 °C) bonding between copper and a ceramic (usually alumina). They are commonly used in power electronics. However, their reliability when exposed to thermal cy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::17133219f94fd23ebc407985167631f2
https://hal.archives-ouvertes.fr/hal-01541230
https://hal.archives-ouvertes.fr/hal-01541230
Akademický článek
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Autor:
Aymen Ben Kabaar, Cyril Buttay, Olivier Dezellus, Rafael Estevez, Anthony Gravouil, Laurent Gremillard
Publikováno v:
HAL
ECPE Workshop "Future of Simulation in Power Electronics Packaging for Thermal and Stress Management"
ECPE Workshop "Future of Simulation in Power Electronics Packaging for Thermal and Stress Management", Nov 2018, Nuremberg, Germany
ECPE Workshop "Future of Simulation in Power Electronics Packaging for Thermal and Stress Management"
ECPE Workshop "Future of Simulation in Power Electronics Packaging for Thermal and Stress Management", Nov 2018, Nuremberg, Germany
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8f9015c959dd3aa1afc36caeed006f85
https://hal.archives-ouvertes.fr/hal-01935060
https://hal.archives-ouvertes.fr/hal-01935060