Zobrazeno 1 - 10
of 125
pro vyhledávání: '"A. Bahgat Shehata"'
Publikováno v:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Time-Resolved Emission (TRE) measurements for circuit debugging, fault localization, and circuit characterization are discussed along with recent detectors developments that have improved their low-voltage sensitivity, while maintaining an excellent
Autor:
Lamberto Duò, Xiaofei Wu, Michele Celebrano, Milena Baselli, Marco Finazzi, Giovanni Isella, Roman Sordan, Fabio Pezzoli, Bert Hecht, Andrea Farina, Monica Bollani, Daniel Chrastina, Alberto Tosi, Andrea Bahgat Shehata, Johann Osmond, Paolo Biagioni, Adriano Della Frera, Jacopo Frigerio
Publikováno v:
ACS photonics 2 (2015): 53–59. doi:10.1021/ph500432k
info:cnr-pdr/source/autori:Celebrano, Michele; Baselli, Milena; Bollani, Monica; Frigerio, Jacopo; Shehata, Andrea Bahgat; Della Frera, Adriano; Tosi, Alberto; Farina, Andrea; Pezzoli, Fabio; Osmond, Johann; Wu, Xiaofei; Hecht, Bert; Sordan, Roman; Chrastina, Daniel; Isella, Giovanni; Duo, Lambert; Finazzi, Marco; Biagioni, Paolo/titolo:Emission Engineering in Germanium Nanoresonators/doi:10.1021%2Fph500432k/rivista:ACS photonics/anno:2015/pagina_da:53/pagina_a:59/intervallo_pagine:53–59/volume:2
info:cnr-pdr/source/autori:Celebrano, Michele; Baselli, Milena; Bollani, Monica; Frigerio, Jacopo; Shehata, Andrea Bahgat; Della Frera, Adriano; Tosi, Alberto; Farina, Andrea; Pezzoli, Fabio; Osmond, Johann; Wu, Xiaofei; Hecht, Bert; Sordan, Roman; Chrastina, Daniel; Isella, Giovanni; Duo, Lambert; Finazzi, Marco; Biagioni, Paolo/titolo:Emission Engineering in Germanium Nanoresonators/doi:10.1021%2Fph500432k/rivista:ACS photonics/anno:2015/pagina_da:53/pagina_a:59/intervallo_pagine:53–59/volume:2
We experimentally investigate the smallest germanium waveguide cavity resonators on silicon that can be designed to work around 1.55 mu m wavelength and observe an almost 30-fold enhancement in the collected spontaneous emission per unit volume when
Publikováno v:
EDFA Technical Articles. 18:16-22
Advancements in photodetector technology are revitalizing time-resolved emission (TRE) techniques in semiconductor failure analysis. In this article, the authors explain how superconducting single-photon detectors improve the capabilities of TRE meas
Autor:
Maryam Massouras, Stephen M. Rossnagel, Bruce B. Doris, Naigang Wang, Andrea Bahgat Shehata, Lynne Gignac, Stephen L. Brown, Hariklia Deligianni, Eugene J. O' Sullivan, Lubomyr T. Romankiw, John A. Ott
Publikováno v:
2016 IEEE International Electron Devices Meeting (IEDM).
We experimentally demonstrate high performance magnetic inductors with Q as high as 17 in the frequency range of 50–250 MHz. These inductors meet target requirements for >90% efficient on-chip power converters. Physics-based models were used to und
Publikováno v:
Scopus-Elsevier
In this work, we demonstrate the effectiveness of deconvolution algorithms in improving the spatial resolution of time-integrated emission images from integrated circuits. A mathematical model of the Point Spread Function (PSF) encompassing both the
Autor:
Celebrano, M., Baselli, M, Bollani, M, Frigerio, J, Bahgat Shehata, A, Della Frera, A, Tosi, A, Farina, A, Osmond, J, Wu, X, Hecht, B, Sordan, R, Chrastina, D, Isella, G, Duò, L, Finazzi, M, Bagioni, P., PEZZOLI, FABIO
Over the last decade Ge has been proposed as one of the most promising materials for light detection, modulation, and emission in silicon-photonics architectures. Its direct band-gap, which is only about 140 meV larger than the indirect one, ensures
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1299::eb92eb42c7b28dcb516865f7cc051a22
http://hdl.handle.net/10281/87914
http://hdl.handle.net/10281/87914
Publikováno v:
2016 IEEE International Reliability Physics Symposium (IRPS).
The very faint spontaneous near-infrared photon emission of scaled SOI FETs fabricated in 32 nm planar and 14 nm FinFET technologies is characterized and modeled for the first time. A high sensitivity and low noise detector is leveraged to measure em
Autor:
Adriano Della Frera, Andrea Farina, Andrea Bahgat Shehata, Andrea Bassi, Alberto Dalla Mora, Antonio Pifferi, Franco Zappa, Rinaldo Cubeddu, Paola Taroni, Ilaria Bargigia, Alberto Tosi
Publikováno v:
Applied spectroscopy 66 (2012): 944–950. doi:10.1366/11-06461
info:cnr-pdr/source/autori:Bargigia, Ilaria; Tosi, Alberto; Shehata, Andrea Bahgat; Della Frera, Adrian; Farina, Andrea; Bassi, Andrea; Taroni, Paola; Dalla Mora, Alberto; Zappa, Franco; Cubeddu, Rinaldo; Pifferi, Antonio/titolo:Time-Resolved Diffuse Optical Spectroscopy up to 1700 nm by Means of a Time-Gated InGaAs%2FInP Single-Photon Avalanche Diode/doi:10.1366%2F11-06461/rivista:Applied spectroscopy/anno:2012/pagina_da:944/pagina_a:950/intervallo_pagine:944–950/volume:66
info:cnr-pdr/source/autori:Bargigia, Ilaria; Tosi, Alberto; Shehata, Andrea Bahgat; Della Frera, Adrian; Farina, Andrea; Bassi, Andrea; Taroni, Paola; Dalla Mora, Alberto; Zappa, Franco; Cubeddu, Rinaldo; Pifferi, Antonio/titolo:Time-Resolved Diffuse Optical Spectroscopy up to 1700 nm by Means of a Time-Gated InGaAs%2FInP Single-Photon Avalanche Diode/doi:10.1366%2F11-06461/rivista:Applied spectroscopy/anno:2012/pagina_da:944/pagina_a:950/intervallo_pagine:944–950/volume:66
We present a new compact system for time-domain diffuse optical spectroscopy of highly scattering media operating in the wavelength range from 1100 nm to 1700 nm. So far, this technique has been exploited mostly up to 1100 nm: we extended the spectra
Autor:
Alessandro Ruggeri, A. Bahgat Shehata, Vikas Anant, Faraz Najafi, Alan J. Weger, Kristen A. Sunter, Karl K. Berggren, Franco Stellari, Peilin Song
Publikováno v:
Optical Sensing, Imaging, and Photon Counting: Nanostructured Devices and Applications.
Today Superconducting Nanowire Single-Photon Detectors (SNSPDs) are commonly used in different photon-starved applications, including testing and diagnostics of VLSI circuits. Detecting very faint signals in the near-infrared wavelength range require
Autor:
Herve Deslandes, Euan Ramsay, Peilin Song, Alan J. Weger, Franco Stellari, Ted R. Lundquist, Andrea Bahgat Shehata
Publikováno v:
IRPS
This work presents a study of the effect of chip temperature on Photon Emission Microscopy (PEM) images acquired with an extended sensitivity near-infrared camera. A detailed analysis of the detection of thermal radiation, as well as leakage and swit