Výsledky vyhledávání

Evaluation of the quality of a spot welding electrode using active illumination by image segmentation

Autor: Ahmed Ahtaiba, Abdulwanis Abdulhadi

Publikováno v: ICAC

The image segmentation algorithm is the most challenging step and requires more computer processing power than the boundary filtering, and the Cullen et al's method, which used the Cullen et al's method to determine the electrodes tip width automatic

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d1d8ff5b90e622948275030dc7f3dd02
https://doi.org/10.23919/iconac.2017.8082026

Zobrazit plný text záznamu

Restoration of an AFM height image using a deflection image at different scanning speeds

Autor: Otman Imrayed, Mohamed Darwish, H. Amreiz, Abdulwanis Abdulhadi, Ahmed Ahtaiba

Publikováno v: ICAC

The principle of the Atomic Force Microscope involves scanning an object using a probing tip that is mounted on the free end of a micro mechanical cantilever. While the sample is scanned horizontally the cantilever deflects. The deflection of the can

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::0dc4ec2d14964e56dc80e4cbe9675ec3
https://doi.org/10.23919/iconac.2017.8082047

Zobrazit plný text záznamu

An approach for the restoration of Atomic Force Microscope images enabling a combination of cantilever and feedback signals at different scanning speeds

Autor: Francis Lilley, A. Ahtaiba, Munther A. Gdeisat, David R. Burton

Publikováno v: ICAC

The Atomic Force Microscope using contact mode forms the image by contacting the sample surface with a sharp tip that is attached to the free end of a cantilever. While the sample is scanned horizontally the cantilever deflects. The deflection of the

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ae11dbcb8c1bb85e03d18c3223009238
https://doi.org/10.1109/iconac.2014.6935500

Zobrazit plný text záznamu

Dissertation/ Thesis

Restoration of AFM images using digital signal and image processing

Autor: Ahtaiba , Ahmed Mohamed A.

All atomic force microscope (AFM) images suffer from distortions, which are principally produced by the interaction between the measured sample and the AFM tip. If the three-dimensional shape of the tip is known, the distorted image can be processed

Externí odkaz: http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.604322