Zobrazeno 1 - 10
of 31
pro vyhledávání: '"A S Shulakov"'
Publikováno v:
Technical Physics Letters. 41:922-925
—Investigation of the energy distribution of occupied states in the valence band and determination of its upper level in films of amorphous Al2O3 and γ-Al2O3, synthesized by atomic layer deposition on a silicon substrate, was performed by X-ray ph
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8c87f699eb5b41ce822f4b5ccb89758
https://doi.org/10.1134/s1063785015100077
https://doi.org/10.1134/s1063785015100077
Autor:
Yu. S. Dedkov, R. E. Ovcharenko, E. P. Savinov, I. I. Tupitsyn, A. S. Shulakov, Elena Voloshina
Publikováno v:
Journal of Experimental and Theoretical Physics. 118:11-17
A procedure is proposed to calculate the shape of the characteristic Xray emission bands of metals with allowance for multielectron effects. The effects of the dynamic screening of a core vacancy by conduc� tion electrons and the Auger effect in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5b7a007922aef6f7e7860adef6f837d1
https://doi.org/10.1134/s1063776114010130
https://doi.org/10.1134/s1063776114010130
Autor:
Franz Schaefers, Andrey Sokolov, O. Yu. Vilkov, Elena O. Filatova, Mihaela Gorgoi, Igor V. Kozhevnikov, A. S. Shulakov, Yu V. Yegorova, A. S. Konashuk
Publikováno v:
Microelectronic Engineering. 109:13-16
Graphical abstractDisplay Omitted Air-exposed Sr-rich-SrTiO3/B/Si-ALD systems (B: SiO2, Si3N4 and HfO2) are studied.Surfaces of all the films are carbonate-enriched by SrCO3 compound.Density of films and Si-B interface width depends on the interlayer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f41a454ac07bddf58ff04b013cda8d6e
https://doi.org/10.1016/j.mee.2013.03.095
https://doi.org/10.1016/j.mee.2013.03.095
Autor:
A. S. Shulakov
Publikováno v:
Journal of Structural Chemistry. 52:1-12
This is a brief review of characteristic X-ray spectroscopy methods used for nondestructive analysis of the atomic chemical composition of solid state materials. The possibilities of emission spectroscopy for atomic and phase chemical analysis of sam
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44e9742fb455a484c7e00e2c351c4a76
https://doi.org/10.1134/s0022476611070018
https://doi.org/10.1134/s0022476611070018
Publikováno v:
Optics and Spectroscopy. 111:940-948
Using the density functional method in the pseudopotential approximation, we calculate the probabilities of X-ray emission transitions and shapes of the L2,3 X-ray emission bands of Mg in crystals of metallic magnesium and monoxide MgO. We have paid
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69cb0ca5d0b8c93cfd6f1f14ed575b14
https://doi.org/10.1134/s0030400x11130157
https://doi.org/10.1134/s0030400x11130157
Publikováno v:
Physics of the Solid State. 52:1957-1961
The factors responsible for the poor agreement between the experimental data on the depth of the generation of the Si L2,3 X-ray emission band excited by an electron impact in SiO2 layers and the results of the calculations performed in terms of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::33c2475c9bec2cccea8c7296ea8b75d5
https://doi.org/10.1134/s1063783410090295
https://doi.org/10.1134/s1063783410090295
Autor:
Dmitry Marchenko, A. S. Shulakov, Andrey Sokolov, A. A. Ovchinnikov, S. Yu. Tver’yanovich, E. P Savinov, Valeri Afanas'ev, Elena O. Filatova
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 181:206-210
Analysis of interfaces between (1 0 0)Si crystal and 5-nm thin HfO 2 overlayers was conducted and the results obtained by a X-ray photoelectron spectroscopy (XPS) in combination with Ar + ion sputtering were compared to the results obtained by a non-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd2147843da053e568b50dac57a40195
https://doi.org/10.1016/j.elspec.2010.04.005
https://doi.org/10.1016/j.elspec.2010.04.005
Publikováno v:
Physics of the Solid State. 51:255-263
The intensities of Si X-ray emission spectra of Si, β-SiC, stishovite, and β-cristobalite crystals are calculated. The wave functions of the initial and final states are obtained in the framework of the density-functional theory with the use of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e65d58f8648bd5f4500a1487d05ae149
https://doi.org/10.1134/s1063783409020085
https://doi.org/10.1134/s1063783409020085
Publikováno v:
Bulletin of the Russian Academy of Sciences: Physics. 72:434-438
The history of the development of ultrasoft X-ray emission depth-resolved spectroscopy is briefly reviewed. The results of the investigation of new model nanostructured materials (metal aluminum layers synthesized by atomic layer deposition on the su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7c360e6e2ae88a634b8754d28f6e280e
https://doi.org/10.3103/s1062873808040047
https://doi.org/10.3103/s1062873808040047
Autor:
A. S. Shulakov, S. V. Bukin
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 1:67-70
The distribution of the phase and chemical composition at an Al2O3/Si interface is studied by depth-resolved ultrasoft x-ray emission spectroscopy. The interface is formed by atomic layer deposition of Al2O3 films of various thicknesses (from several
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::56452e0a082f51e5fe2e0d7ba70ada87
https://doi.org/10.1134/s1027451007010132
https://doi.org/10.1134/s1027451007010132