Zobrazeno 1 - 10
of 51
pro vyhledávání: '"A S, Kolomiytsev"'
Publikováno v:
Russian Microelectronics. 51:126-133
Abstract This paper presents the results of experimental studies of the modes of formation of nanosized structures on the surface of a silicon substrate by the method of focused ion beams (FIB). The regularities of the effect of the ion beam current,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f31336f42d45360e64d70252e680d31
https://doi.org/10.1134/s1063739722030076
https://doi.org/10.1134/s1063739722030076
Autor:
N. О. Vikhlyantseva, S. Kolomiytsev, А. А. Basharina, Т. А. Bogush, А. В. Ravcheeva, V. Yu. Kirsanov, Е. А. Bogush, V. S. Kosorukov, Е. А. Rukavishnikova
Publikováno v:
Antibiotics and Chemotherapy. 66:38-46
In the study of 125 patients after radical surgery for non-small cell lung cancer (NSCLC), distinctive clinicopathological parameters of this disease were found. Thus, the majority of patients with NSCLC were smokers (73%), men had significantly hig
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16e83645529f864c6aef0efbcb143c20
https://doi.org/10.37489/0235-2990-2021-66-1-2-38-46
https://doi.org/10.37489/0235-2990-2021-66-1-2-38-46
Autor:
A S, Kolomiytsev, A L, Gromov, O I, Il'in, I V, Panchenko, A V, Kotosonova, A, Ballouk, D, Rodriguez, O A, Ageev
Publikováno v:
Ultramicroscopy. 234:113481
At present, the focused ion beam method is an effective technique for nanoscale profiling of a solid surface and prototyping of micro- and nanoscale structures. The article reveals the results of experimental studies on improving the accuracy and res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a64415982dfcc3f24679f101effefb2
https://doi.org/10.1016/j.ultramic.2022.113481
https://doi.org/10.1016/j.ultramic.2022.113481
Autor:
S. A. Lisitsyn, V. S. Klimin, M. S. Solodovnik, S. V. Balakirev, Boris G. Konoplev, V. I. Avilov, Oleg A. Ageev, A. S. Kolomiytsev
Publikováno v:
Nanotechnologies in Russia. 13:26-33
The nanoscale profiling modes of epitaxial GaAs layers are experimentally studied through focused ion beams (FIB). The regularities of the influence of ion current and single FIB exposure time on the geometric characteristics of the forming nanosized
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f2d62953f5ed4fda9beaeb6ec5403aec
https://doi.org/10.1134/s199507801801007x
https://doi.org/10.1134/s199507801801007x
Publikováno v:
Journal of Physics: Conference Series. 2086:012201
The paper presents the results of experimental studies of the influence of the main parameters of a focused ion beam (FIB) during surface profiling on the accuracy of transfer of a pattern to a silicon substrate to create nanoscale field emission str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa05c7e59f7ce62abbb87d754b622e94
https://doi.org/10.1088/1742-6596/2086/1/012201
https://doi.org/10.1088/1742-6596/2086/1/012201
Publikováno v:
Journal of Physics: Conference Series. 2086:012204
In this work, we carried out an investigation of commercial atomic force microscope (AFM) probes for contact and semi-contact modes, which were modified by focused ion beam (FIB). This method was used to modify the original tip shape of silicon AFM p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be84156cc0ab3c4303289b300701d8c1
https://doi.org/10.1088/1742-6596/2086/1/012204
https://doi.org/10.1088/1742-6596/2086/1/012204
Autor:
Al. V. Bykov, Oleg A. Ageev, A. S. Kolomiytsev, S. A. Lisitsyn, Boris G. Konoplev, M. V. Il’ina, O. I. Il’in
Publikováno v:
Russian Microelectronics. 46:468-473
The results of experimental studies of the Pt structure with the thickness ranging from (0.48 ± 0.1) to (24.38 ± 0.1) nm ion beam including deposition by focused ion beam are presented. The rate of ion beam including deposition of Pt, which dependi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd6f4d219eb28c51ed70fa282c700c77
https://doi.org/10.1134/s106373971707006x
https://doi.org/10.1134/s106373971707006x
Autor:
T. V. Mikhailova, S. Yu. Krasnoborodko, Vladimir N. Berzhansky, O.I. Ilin, M. F. Bulatov, A.N. Shaposhnikov, Yu. E. Vysokikh, D. V. Churikov, V. I. Shevyakov, A. S. Kolomiytsev
Publikováno v:
Journal of Magnetism and Magnetic Materials. 529:167837
Improving the ways of magnetic structure investigation with the lowest possible resolution is important in the study and practical implementation of fundamental magnetism. Here we discuss one of the most modern magneto-optical method of domain struct
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd713abe080755ee2afad386338f931b
https://doi.org/10.1016/j.jmmm.2021.167837
https://doi.org/10.1016/j.jmmm.2021.167837
Autor:
Alexander A. Fedotov, Vladimir A. Smirnov, Yuriy F. Blinov, O. I. Il’in, Oleg A. Ageev, M. V. Il’ina, Boris G. Konoplev, A. S. Kolomiytsev
Publikováno v:
Carbon. 123:514-524
This paper proposes a memristive switching mechanism of an individual vertically aligned carbon nanotube related to the formation and subsequent redistribution of non-uniform elastic strain and piezoelectric charge in the nanotube under the influence
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a50b7c5a4927b2da72beb876eae87966
https://doi.org/10.1016/j.carbon.2017.07.090
https://doi.org/10.1016/j.carbon.2017.07.090
Publikováno v:
AIP Conference Proceedings.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bd59f2e37f6e82aeb791bb8d0ef26a9
https://doi.org/10.1063/1.5087673
https://doi.org/10.1063/1.5087673