Zobrazeno 1 - 10
of 148
pro vyhledávání: '"A Moses Ezhil Raj"'
Publikováno v:
Materials Research Express, Vol 8, Iss 5, p 055005 (2021)
The effect of post-growth annealing on the phase transformation leading to phase pure hematite ( α -Fe _2 O _3 ) nanoparticles is reported in this work. Co-precipitation technique was used to synthesise iron oxide nanoparticles by adjusting the pH o
Externí odkaz:
https://doaj.org/article/1368fe8369434fabb3aaa1f5eda6d024
Autor:
Ravi Dhas, C., Venkatesh, R., Sivakumar, R., Dhandayuthapani, T., Subramanian, B., Sanjeeviraja, C., Moses Ezhil Raj, A.
Publikováno v:
In Journal of Alloys and Compounds 5 May 2019 784:49-59
Publikováno v:
In Journal of Physics and Chemistry of Solids January 2018 112:262-269
Autor:
Ravi Dhas, C., Venkatesh, R., David Kirubakaran, D., Princy Merlin, J., Subramanian, B., Moses Ezhil Raj, A.
Publikováno v:
In Materials Chemistry and Physics 15 January 2017 186:561-573
Autor:
Sajilal, K., Moses Ezhil Raj, A.
Publikováno v:
In Optik - International Journal for Light and Electron Optics February 2016 127(3):1442-1449
Autor:
Ravi Dhas, C., Venkatesh, R., Jothivenkatachalam, K., Nithya, A., Suji Benjamin, B., Moses Ezhil Raj, A., Jeyadheepan, K., Sanjeeviraja, C.
Publikováno v:
In Ceramics International September 2015 41(8):9301-9313
Assessment of CuO thin films for its suitablity as window absorbing layer in solar cell fabrications
Publikováno v:
In Materials Research Bulletin August 2015 68:1-8
Autor:
Ravidhas, C., Juliat Josephine, A., Sudhagar, P., Devadoss, Anitha, Terashima, C., Nakata, K., Fujishima, Akira, Moses Ezhil Raj, A., Sanjeeviraja, C.
Publikováno v:
In Materials Science in Semiconductor Processing February 2015 30:343-351
Publikováno v:
Brazilian Journal of Physics. 51:1550-1564
Cadmium oxide (CdO) photocatalysts in pure and doped form have been prepared using chemically controlled co-precipitation method followed by calcination at different temperatures, to study the size-dependent structural properties and its influence on
Publikováno v:
In Materials Science in Semiconductor Processing June 2013 16(3):797-801