Zobrazeno 1 - 10
of 53
pro vyhledávání: '"A M, Borovikov"'
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 7, Pp 72-80 (2022)
The KLASS computer program planned for development is designed to work as a part of the ARION-plus software package and allows you to perform an automated assessment of the reliability of electronic products, including semiconductor devices. At the s
Externí odkaz:
https://doaj.org/article/653128222b384bdd93290c6c6f5d3495
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 4, Pp 36-43 (2022)
When evaluating the individual reliability of semiconductor devices by gradual failures for a given operating time, the value of the electrical parameter of a particular instance for this operating time is predicted using the simulation method. To ob
Externí odkaz:
https://doaj.org/article/f7c51d510fb14ab99b1354c3e9dc8e43
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 20, Iss 1, Pp 92-100 (2022)
The threshold logic method used for electronic products when assessing their reliability in the form of predicting the performance class of products for a given operating time (K1 is a class of operable ones, K0 is a class of inoperable copies) provi
Externí odkaz:
https://doaj.org/article/f8c6123aa03c4c7dbc86f2f810d94048
Publikováno v:
Informatika, Vol 18, Iss 1, Pp 84-95 (2021)
The reliability of computer-based information systems is largely determined by the reliability of the developed application software. The failure rate of its computer program is considered as an indicator of the reliability of the application softwar
Externí odkaz:
https://doaj.org/article/855b029353cb487a91830f55f7d0c396
Autor:
S. M. Borovikov, V. O. Kaziuchyts
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 19, Iss 1, Pp 88-95 (2021)
When assembling electronic complexes for medical purposes, it is important to install highly reliable semiconductor devices in electronic equipment. Experimental studies and the example of high-power bipolar transistors in this work show how you can
Externí odkaz:
https://doaj.org/article/2b868f8f419244a381b9a16528d81ae4
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 18, Iss 5, Pp 80-88 (2020)
Individual forecasting of the reliability of semiconductor devices, taking into account gradual failures, is an urgent task, as it allows you to choose highly reliable instances for critical electronic devices of long-term functioning. In relation to
Externí odkaz:
https://doaj.org/article/9389fe4c73a04b3fb1d50cc2c6da93d6
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 0, Iss 5, Pp 45-51 (2019)
To predict the expected reliability of the developed software applications, a method based on the use of the statistical model of the operability of software is proposed. The model is based on generalized statistical data taken from domestic and fore
Externí odkaz:
https://doaj.org/article/83eafb1135f447ed8632e78f4f2d42d7
Autor:
S. M. Borovikov, E. N. Shneiderov
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 0, Iss 6, Pp 5-11 (2019)
The method of obtaining the model, describing degradation regularity for function parameter of electronic device (ED) sample, was systematized. The probability distribution function (for operating time of interest) of function parameter of ED sample
Externí odkaz:
https://doaj.org/article/f1a7016fb5fc4cf2ae703c2682ca74f3
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 0, Iss 7, Pp 61-66 (2019)
A new approach to the evaluation of the functioning of the electronic systems for medical purposes is proposed. This approach takes into account the sustainable system failures and possible temporary system device failures due to the impact of their
Externí odkaz:
https://doaj.org/article/0db1fcbb5b0d4b14b43b1f71d5682a28
Publikováno v:
Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki, Vol 0, Iss 8, Pp 10-16 (2019)
For crystals of EEPROM integrated circuits (ICs) a method for predicting of information storage time after the power is turned off is provided. Prediction is performed using the accelerated tests, which are considered as the temperature effects that
Externí odkaz:
https://doaj.org/article/c2e21c477ab94f7d9ba21aa2b9c54092