Zobrazeno 1 - 10
of 25
pro vyhledávání: '"A E, Reznikova"'
Publikováno v:
Applied optics. 55(25)
Lenses with high numerical aperture are required for images with very high spatial resolution, which is difficult to realize in the x-ray range because of low-refraction-index decrement and relatively high absorption of x-rays in the material. Howeve
Autor:
Jürgen Mohr, G. T. Baumbach, E. Reznikova, Yu.L. Pivovarov, Venera Altapova, Alexey Ershov, Tomy dos Santos Rolo, Vladimir F. Pichugin
Publikováno v:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 6:394-397
The imaging methods used at the ANKA Synchrotron Light Source (Institute for Synchrotron Radiation, Karlsruhe Institute of Technology) are briefly reviewed. Examples of recent applications of the phase-contrast imaging method using a grating interfer
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 266:2165-2168
A set of compound refractive lenses (CRLs), mounted on a silicon wafer, was obtained from the Institut fur Mikrostrukturtechnik Karlsruhe. The CRLs were characterized at the BAMline at the synchrotron BESSYII in Berlin. It could be demonstrated that
Publikováno v:
Microsystem Technologies. 14:1299-1303
The reflectivity of grazing angle X-ray mirrors, used for X-ray deep lithography, is tested by means of a calorimetric method. A deviation in the reflectivity of a used mirror compared with the reflectivity of a clean surface is observed. This deviat
Publikováno v:
physica status solidi (a). 204:2811-2816
Planar X-ray refractive lenses with parabolic surface profile, and in crossed geometry to provide 2D focusing, are fabricated from SU-8 polymer using the LIGA process and deep X-ray lithography technology. A transmission X-ray microscope (TXM) using
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 603:150-152
LIGA including deep X-ray lithography has been used to form cross patterns in free-standing foils of different thickness between 20 and 2000 μm. The patterns show bandpass filter behaviors for wavelengths in the 300–800 μm region. Transmittances
Publikováno v:
Microsystem Technologies. 14:1727-1729
In this paper, the new method of measurements is presented for the technological control of the lithographic fabrication of high aspect ratio microstructures with complex side-wall profiles. The sampling procedure includes pouring polymer glue on a s
Autor:
T. Weitkamp, I. Zanette, G. Schulz, M. Bech, S. Rutishauser, S. Lang, T. Donath, A. Tapfer, H. Deyhle, P. Bernard, J.-P. Valade, E. Reznikova, J. Kenntner, J. Mohr, B. Müller, F. Pfeiffer, C. David, J. Baruchel, Ian McNulty, Catherine Eyberger, Barry Lai
Publikováno v:
AIP Conference Proceedings.
We report on the implementation of X‐ray grating interferometry at the imaging beamline ID19 of the European Synchrotron Radiation Facility (ESRF). We give a brief overview of the results obtained so far with this instrument and on ongoing developm
Autor:
M. Simon, G. Ahrens, A. Last, J. Mohr, V. Nazmov, E. Reznikova, A. Voigt, Ian McNulty, Catherine Eyberger, Barry Lai
Publikováno v:
AIP Conference Proceedings.
For hard x‐ray transmission microscopy at photon energies higher than 15 keV we design refractive condenser and imaging elements to be used with synchrotron light sources as well as with x‐ray tube sources. The condenser lenses are optimized for
Publikováno v:
AIP Conference Proceedings.
In order to meet the demand for X‐ray lenses with large apertures and, hence, photon flux, a new type of X‐ray lenses has been developed: Rolled prismatic X‐ray lenses feature a vast number of refracting surfaces to increase transparency and ap