Zobrazeno 1 - 10
of 103
pro vyhledávání: '"A D Hirschman"'
Publikováno v:
ECS Transactions. 98:131-139
Flash lamp annealing (FLA) has been explored as an alternative to excimer laser annealed low-temperature polycrystalline silicon (LTPS) for display applications and has shown potential to streamline and decrease the cost of fabrication while maintain
Publikováno v:
ECS Meeting Abstracts. :1282-1282
The invention of portable electronic devices had a huge impact on the growing interest in flat panel displays. Since the first report in 2004 on amorphous Indium Gallium Zinc Oxide (a-IGZO) thin film transistors (TFTs), many companies have become int
Publikováno v:
ECS Meeting Abstracts. :1260-1260
There is wide variation in the understanding of the interaction and/or independence of channel mobility and charge trapping in IGZO TFTs. A new interpretation of transport behavior proposes an intrinsic channel mobility with distinctive temperature d
Publikováno v:
ECS Transactions. 90:79-88
Autor:
Kevin S. Jones, Karl D. Hirschman, P. G. Whiting, Jayantha Senawiratne, J. Gregory Couillard, Johannes Moll, Robert George Manley, Carlo Kosik Williams
Publikováno v:
Journal of Materials Research. 34:1654-1668
A new deep level transient spectroscopy (DLTS) technique is described, called half-width at variable intensity analysis. This method utilizes the width and normalized intensity of a DLTS signal to determine the activation energy and capture cross sec
Autor:
Robert George Manley, Glenn Packard, Viraj Garg, Paul Bischoff, Karl D. Hirschman, Karthik Bhadrachalam, Adam Rosenfeld
Publikováno v:
ECS Transactions. 86:57-72
The development of low-temperature polycrystalline silicon (LTPS) based on excimer laser annealing (ELA) has realized CMOS TFTs with notable electrical performance. The flat-panel display industry is searching for alternative LTPS strategies which ar
Autor:
Karl D. Hirschman, Jason Konowitch, Rahnuma Rifat Chowdhury, Prashant Ganesh, Julia Okvath, Robert George Manley, Muhammad Salahuddin Kabir, Harithshanmaa Sethupathi
Publikováno v:
ECS Transactions. 86:125-133
The focus of this work is on the performance degradation of thermally stressed IGZO TFTs with SiO2 for both the gate dielectric and back-channel passivation material. The TFT fabrication process included a post-passivation 400 °C O2 anneal to adjust
Publikováno v:
ECS Transactions. 86:153-166
The existence of band-tail states (BTS) in indium-gallium-zinc oxide (IGZO) results in TFTs with electrical characteristics that are not well represented by conventional device models. Common parameters such as threshold voltage and channel mobility
Autor:
Santosh K. Kurinec, Scott Williams, Glenn Packard, Karl D. Hirschman, Alex Taylor, Carolyn Spaulding
Publikováno v:
Materials Letters. 305:130780
We report doping of thin (~60 nm) amorphous silicon (a-Si) on glass substrate to form n + polycrystalline silicon on glass in selective regions using Monolayer doping (MLD) via Flash Lamp Annealing (FLA). The phosphorus monolayer was formed on the ex
Autor:
Jay D. Hirschman, Neil Mehta, Angela D. Liese, Sonya J. Jones, Alisha Coleman-Jensen, Xiaoguang Ma, Edward A. Frongillo, Nancy L. Fleischer, Ross A. Hammond, Craig Gundersen
Publikováno v:
Journal of Hunger & Environmental Nutrition. 13:362-384
Eliminating childhood hunger and supporting households in need of food are US policy priorities, because food insecurity in the US remains elevated postrecession. The objective of this study was to bring a systems science lens to the issue of childho