Simultaneous correlative scanning electron and high-NA fluorescence microscopy.

Autor: Nalan Liv, A Christiaan Zonnevylle, Angela C Narvaez, Andries P J Effting, Philip W Voorneveld, Miriam S Lucas, James C Hardwick, Roger A Wepf, Pieter Kruit, Jacob P Hoogenboom

Publikováno v: PLoS ONE, Vol 8, Iss 2, p e55707 (2013)

Correlative light and electron microscopy (CLEM) is a unique method for investigating biological structure-function relations. With CLEM protein distributions visualized in fluorescence can be mapped onto the cellular ultrastructure measured with ele

Externí odkaz: https://doaj.org/article/cfdbb37880ea48f19b8614e31e96eb62

Estimating Step Heights from Top-Down SEM Images

Autor: Cornelis W. Hagen, Kerim T. Arat, Aernout Christiaan Zonnevylle, Pieter Kruit, Jens Bolten

Publikováno v: Microscopy and Microanalysis, 25(4)

Scanning electron microscopy (SEM) is one of the most common inspection methods in the semiconductor industry and in research labs. To extract the height of structures using SEM images, various techniques have been used, such as tilting a sample, or

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::253d115baf1f61e24ca4e364503f7ffd
http://resolver.tudelft.nl/uuid:08011abf-f5aa-46e8-b300-1ca1c0294f6c

Electron beam lithography on curved or tilted surfaces: Simulations and experiments

Autor: Wilhelmus S. M. M. Ketelaars, Aernout Christiaan Zonnevylle, Kerim T. Arat, Cornelis W. Hagen, Nikola Belic, Ulrich Hofmann

Publikováno v: Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 37(5)

There is a growing interest for patterning on curved or tilted surfaces using electron beam lithography. Computational proximity correction techniques are well established for flat surfaces and perpendicular exposure, but for curved and tilted surfac

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eff533541434c2d28a1fbb93c3a82f9a
https://doi.org/10.1116/1.5120632

Integrated Microscopy: Highly Accurate Light-Electron Image Correlation Anywhere on a Sample

Autor: Aernout Christiaan Zonnevylle, Angela C. Narvaez, L.M. Voortman, Pieter Kruit, Jacob P. Hoogenboom, Martijn Theo Haring, Nalan Liv

Publikováno v: Microscopy and Microanalysis. 23:1272-1273

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::064714d37a6a87f851f72c0edc39f8b6
https://doi.org/10.1017/s1431927617007024

Loss of SMAD4 Alters BMP Signaling to Promote Colorectal Cancer Cell Metastasis via Activation of Rho and ROCK

Autor: Hans Morreau, Liudmila L. Kodach, James C. H. Hardwick, A. Christiaan Zonnevylle, Rutger J. Jacobs, Nalan Liv, Tom van Wezel, Gijs R. van den Brink, Karien E. de Rooij, Maikel P. Peppelenbosch, Jacob P. Hoogenboom, G. Johan A. Offerhaus, Carel J. M. van Noesel, Daniel W. Hommes, Hein W. Verspaget, Philip W. Voorneveld, Izak Biemond, Peter ten Dijke

Publikováno v: Gastroenterology, 147(1), 196-U328. W.B. Saunders
Gastroenterology, 147(1), 196-208.e13. W.B. Saunders Ltd
Gastroenterology
Gastroenterology, 147(1), 196-U328

BACKGROUND & AIMS: SMAD4 frequently is lost from colorectal cancers (CRCs), which is associated with the development of metastases and a poor prognosis. SMAD4 loss is believed to alter transforming growth factor beta signaling to promote tumor progre

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a1dfbcc3b7a822b19459a04e34378f09
https://hdl.handle.net/1887/117364