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pro vyhledávání: '"A, Mauran"'
Autor:
Schwab, L, Allain, P, Mauran, N, Dollat, X, Mazenq, L, Lagrange, D, Gély, M, Hentz, S, Jourdan, G, Favero, I, Legrand, B
Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale, thus eluc
Externí odkaz:
http://arxiv.org/abs/2109.02478
Publikováno v:
In Journal of Energy Storage 15 April 2024 84 Part A
Publikováno v:
In Annales médico-psychologiques October 2023
Publikováno v:
In Microelectronics Reliability May 2023 144
Akademický článek
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Publikováno v:
In Ceramics International 15 July 2022 48(14):19694-19702
Autor:
Mauran, Guilhem, Caron, Benoit, Beck, Lucile, Détroit, Florent, Noûs, Camille, Tombret, Olivier, Pleurdeau, David, Bahain, Jean-Jacques, Lebon, Matthieu
Publikováno v:
In Journal of Archaeological Science: Reports June 2022 43
Autor:
Mauran, Laura, Assailly, Coralie, Goudreau, Sébastien R., Odaert, Benoît, Guichard, Gilles, Pasco, Morgane
Publikováno v:
ChemBioChem; 10/16/2024, Vol. 25 Issue 20, p1-6, 6p
Autor:
Mauran, Philippe
Publikováno v:
Revue d'histoire du protestantisme, 2021 Jan 01. 6(1), 51-80.
Externí odkaz:
https://www.jstor.org/stable/45472258
Autor:
L. Schwab, P. E. Allain, N. Mauran, X. Dollat, L. Mazenq, D. Lagrange, M. Gély, S. Hentz, G. Jourdan, I. Favero, B. Legrand
Publikováno v:
Microsystems & Nanoengineering, Vol 8, Iss 1, Pp 1-14 (2022)
Abstract Atomic force microscopy (AFM) has been consistently supporting nanosciences and nanotechnologies for over 30 years and is used in many fields from condensed matter physics to biology. It enables the measurement of very weak forces at the nan
Externí odkaz:
https://doaj.org/article/be26b9d481b84e2ba0dd6fd34846fdde