Zobrazeno 1 - 9
of 9
pro vyhledávání: '"韦 智"'
Publikováno v:
Science & Technology of Food Industry; May2024, Vol. 45 Issue 9, p45-53, 9p
Publikováno v:
Science & Technology of Food Industry; Jan2024, Vol. 45 Issue 2, p67-74, 8p
Publikováno v:
Electric Power Engineering Technology; 2023, Vol. 42 Issue 6, p141-152, 12p
Publikováno v:
China Oncology; 2022, Vol. 32 Issue 11, p1091-1097, 7p
Publikováno v:
Shandong Medical Journal. 2/3/2017, Vol. 57 Issue 5, p67-69. 3p.
Publikováno v:
Journal of National University of Defense Technology / Guofang Keji Daxue Xuebao; 2020, Vol. 42 Issue 4, p85-92, 8p
Autor:
Chih-Kai Wei, 韋智凱
94
Besides hardware BIST and scan chains, software-based self-testing (SBST) is an alternative to test a processor core, and this methodology is becoming more and more popular. As implied in the name, in SBST methodology a processor executes its
Besides hardware BIST and scan chains, software-based self-testing (SBST) is an alternative to test a processor core, and this methodology is becoming more and more popular. As implied in the name, in SBST methodology a processor executes its
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/26099496693720695275
Publikováno v:
Shandong Medical Journal; 11/3/2017, Vol. 57 Issue 41, p54-56, 3p