Zobrazeno 1 - 4
of 4
pro vyhledávání: '"陳瑞峰"'
Autor:
Ruei-Fong Chen, 陳瑞峰
103
There is no doubt that high quality is the irreversible trend for the development of carrier tape in the days ahead. As far as high quality requirement is concerned, supplemental inspection will unquestionably become an important procedure,
There is no doubt that high quality is the irreversible trend for the development of carrier tape in the days ahead. As far as high quality requirement is concerned, supplemental inspection will unquestionably become an important procedure,
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/uze4py
Autor:
Chen, Ruei-Fong, 陳瑞峰
97
The purpose of conducting this research is to acquire an understanding of the cur-rent status of leisure activity participation and consumer behavior while using the citizen travel cards among junior high school part-time administrative teach
The purpose of conducting this research is to acquire an understanding of the cur-rent status of leisure activity participation and consumer behavior while using the citizen travel cards among junior high school part-time administrative teach
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/59734596051482020708
Autor:
Chen Ruey Feng, 陳瑞峰
89
As there is no systematic analysis for the connection between the travel website and it’s “Customer Relationship Management, CRM”, this research is an exploratory study by the approach of Grounded Theory. Taking six local travel website
As there is no systematic analysis for the connection between the travel website and it’s “Customer Relationship Management, CRM”, this research is an exploratory study by the approach of Grounded Theory. Taking six local travel website
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/18733181935163525941
Autor:
Ruey-Feng Chen, 陳瑞峰
87
Design for Testability(DFT) techniques, which ease the testing problem of complex VLSI chips and system, have become well-known, and are incorporated in many commercial logic synthesis tools to provide testable designs. The approach is based
Design for Testability(DFT) techniques, which ease the testing problem of complex VLSI chips and system, have become well-known, and are incorporated in many commercial logic synthesis tools to provide testable designs. The approach is based
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/12162736621829506454