Zobrazeno 1 - 10
of 12
pro vyhledávání: '"陈玉娇"'
Publikováno v:
Science & Technology of Food Industry; Feb2024, Vol. 45 Issue 3, p235-241, 7p
Publikováno v:
Food & Fermentation Industries; 2024, Vol. 50 Issue 1, p170-176, 7p
Publikováno v:
Shandong Medical Journal. 8/15/2021, Vol. 61 Issue 23, p18-23. 6p.
Publikováno v:
Computer Integrated Manufacturing Systems; Jun2023, Vol. 29 Issue 6, p1930-1940, 11p
Autor:
张维光 Zhang Weiguang, 于洵 Yu Xun, 韩峰 Han Feng, 张发强 Zhang Faqiang, 吴银花 Wu Yinhua, 陈玉娇 Chen Yujiao
Publikováno v:
Infrared and Laser Engineering. 51:20210756
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34a8833add0ddca21028089ebf806202
https://doi.org/10.3788/irla20210756
https://doi.org/10.3788/irla20210756
Autor:
CHEN, YU-CHIAO, 陳玉嬌
管理學院工業工程與管理EMBA專班
107
In the early days, the customer service center provided customer service through voice. However, in the external environment, the changes in the popularity of the Internet and the mobile devic
107
In the early days, the customer service center provided customer service through voice. However, in the external environment, the changes in the popularity of the Internet and the mobile devic
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/3yxyy2
Publikováno v:
Journal of Computer Engineering & Applications; 2021, Vol. 57 Issue 22, p139-146, 8p
Publikováno v:
Journal of Food Safety & Quality; Dec2020, Vol. 11 Issue 23, p8971-8976, 6p
Publikováno v:
ACTA PHOTONICA SINICA. 48:329002
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b1a803e74979e844fe81f01942646a16
https://doi.org/10.3788/gzxb20194803.0329002
https://doi.org/10.3788/gzxb20194803.0329002
Autor:
Yu-Chiao Chen, 陳玉嬌
91
As the size of the wafers used in the fabrication of integrated circuits（IC） increases, the clustering of defects on wafers becomes increasingly apparent. When a conventional c-chart, based on the Poisson distribution, is used to monitor
As the size of the wafers used in the fabrication of integrated circuits（IC） increases, the clustering of defects on wafers becomes increasingly apparent. When a conventional c-chart, based on the Poisson distribution, is used to monitor
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/66061839375997545240