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Autor:
陈龙超 Chen Long-Chao, 李. 慧. Li Hui, 余. 佳. Yu Jia, 陈廷爱 Chen Ting-Ai, 高玉峰 Gao Yu-Feng, 郑. 炜. Zheng Wei
Publikováno v:
Chinese Optics. 11:307-328
Structured illumination microscopy(SIM) is capable of providing super-resolution imaging. It breaks the diffraction limit by moving the high-frequency information of objects into the detectable frequency band of the optical imaging system via frequen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24971e349b06b66babb7fe9a9b9e8502
https://doi.org/10.3788/co.20181103.0307
https://doi.org/10.3788/co.20181103.0307
