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pro vyhledávání: '"门玉涛 Men Yu-tao"'
Autor:
王世斌 Wang Shi-bin, 门玉涛 Men Yu-tao, 贾海坤 Jia Hai-kun, 郭振山 Guo Zhen-shan, 何巍 He Wei, 李林安 Li Lin-an
Publikováno v:
Optics and Precision Engineering. 19:2293-2299
This paper presents a basic structure combined with a film and a substrate to investigate the damage and deformation of thin films and to predict the life time of MEMS.The bifurcation and fracture of thin films under a tensive load were determined by
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::83e51adfd3532ce61ed37718d13e8e67
https://doi.org/10.3788/ope.20111909.2293
https://doi.org/10.3788/ope.20111909.2293
