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pro vyhledávání: '"鄭春興"'
Autor:
Trinh Xuan Hung, 鄭春興
105
This research develops two low-coherence shearing interference microscopes (SIMs) capable of profiling microstructure of samples. The first one is based on the mechanisms of a Savart polariscope and an afocal microscopic system, and it is ab
This research develops two low-coherence shearing interference microscopes (SIMs) capable of profiling microstructure of samples. The first one is based on the mechanisms of a Savart polariscope and an afocal microscopic system, and it is ab
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/t3k94h
