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pro vyhledávání: '"鄭元仁"'
Autor:
Yuan-Jen Cheng, 鄭元仁
99
In semiconductor FAB clean rooms, due to the heavy metal wall surrounding the FAB building the reflected signals almost have no loss upon hitting the metal walls such that the reflected signal and direct path signal have a similar strength bu
In semiconductor FAB clean rooms, due to the heavy metal wall surrounding the FAB building the reflected signals almost have no loss upon hitting the metal walls such that the reflected signal and direct path signal have a similar strength bu
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/25895239888853884698