Zobrazeno 1 - 3
of 3
pro vyhledávání: '"郑念祖"'
Publikováno v:
Journal of Northeastern University (Natural Science). 7/15/2018, Vol. 39 Issue 7, p970-975. 6p.
Publikováno v:
Acta Automatica Sinica; May2018, Vol. 44 Issue 5, p915-921, 7p
Autor:
Cheng Nean Chu, 鄭念祖
90
Interest in low-frequency noise behavior of deep-submicron Si MOSFETs is first of all drawn by analog applications, where noise minimization is a key issue in circuit sensitivity and detection. Nowadays, low frequency noise receives growing a
Interest in low-frequency noise behavior of deep-submicron Si MOSFETs is first of all drawn by analog applications, where noise minimization is a key issue in circuit sensitivity and detection. Nowadays, low frequency noise receives growing a
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/82099612149339368892
