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Autor:
Chin-Shun Hsu, 許欽順
101
There are many types of semiconductor testing. The main object of this study focuses on the final testing for the volatile memory. We first introduced how the memory works and its access motion, and later perform in Advantest memory tester f
There are many types of semiconductor testing. The main object of this study focuses on the final testing for the volatile memory. We first introduced how the memory works and its access motion, and later perform in Advantest memory tester f
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/93528107967627469884
