Zobrazeno 1 - 10
of 15
pro vyhledávání: '"蔡岩"'
Publikováno v:
Journal of Nanjing Medical University: Natural Sciences. 2024, Vol. 44 Issue 6, p868-875. 8p.
Autor:
Yan-Jiun Tsai, 蔡岩峻
99
It is well-known that channel hot-carrier (CHC) reliability test is executed with constant voltage stress (CVS) to investigate MOSFET degradation in wafer foundry. Furthermore, the device lifetime (τ) is thus determined. The industrial pract
It is well-known that channel hot-carrier (CHC) reliability test is executed with constant voltage stress (CVS) to investigate MOSFET degradation in wafer foundry. Furthermore, the device lifetime (τ) is thus determined. The industrial pract
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/37y964
Publikováno v:
Feed Industry; 2024, Vol. 45 Issue 20, p105-113, 9p
89
Incineration technology, which requires much less land use and minimal contribution towards water and soil pollution as compared with landfills, has become the means to dispose of or treat municipal, hazardous and intractable wastes in Taiwan
Incineration technology, which requires much less land use and minimal contribution towards water and soil pollution as compared with landfills, has become the means to dispose of or treat municipal, hazardous and intractable wastes in Taiwan
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/54937046531123106721
Publikováno v:
Chinese Journal of Veterinary Science / Zhongguo Shouyi Xuebao; may2015, Vol. 35 Issue 5, p832-837, 6p