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pro vyhledávání: '"游江津"'
Autor:
Jiang-Jin You, 游江津
102
In this study, the inverted-staggered thin film transistors were used to investigate the yield improvement of devices with copper process. We utilized the different metal materials that were deposited as the metal I electrode and different c
In this study, the inverted-staggered thin film transistors were used to investigate the yield improvement of devices with copper process. We utilized the different metal materials that were deposited as the metal I electrode and different c
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/19959479361836482528
