Zobrazeno 1 - 2
of 2
pro vyhledávání: '"楊皓義"'
Autor:
Yang, Hao-I, 楊皓義
100
This thesis discusses the reliability and tolerance techniques for the robust nanoscale SRAM design. It provides comprehensive analyses on the impacts of Bias Temperature Instability (BTI) and gate-oxide breakdown on power-gated SRAMs, inclu
This thesis discusses the reliability and tolerance techniques for the robust nanoscale SRAM design. It provides comprehensive analyses on the impacts of Bias Temperature Instability (BTI) and gate-oxide breakdown on power-gated SRAMs, inclu
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/03899148500620045179
Autor:
Hao-I Yang, 楊皓義
93
Today, “Information Technology (IT)” develops very fast, and microprocessors play more and more important roles in IT industry. Improving the performance of them is very important. Otherwise, the cost of mask is more and more expansive. H
Today, “Information Technology (IT)” develops very fast, and microprocessors play more and more important roles in IT industry. Improving the performance of them is very important. Otherwise, the cost of mask is more and more expansive. H
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/86542146318845692301