Zobrazeno 1 - 2
of 2
pro vyhledávání: '"梁益瑞"'
Autor:
LIANG, I-JUI, 梁益瑞
105
Vdd(min) is defined as the lowest supply voltage at which a device can work on right logic states. For 65nm and smaller process of CMOS VLSI manufacturing, the IDDQ based outlier analysis can not be used to detect the defects, and Vdd(min) t
Vdd(min) is defined as the lowest supply voltage at which a device can work on right logic states. For 65nm and smaller process of CMOS VLSI manufacturing, the IDDQ based outlier analysis can not be used to detect the defects, and Vdd(min) t
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/54bf5h
Autor:
Liang,Yijui, 梁益瑞
99
The purpose of this research was to improve the present baking oven. The distribution of the air flow in the chamber of the present baking oven is extremely non-uniform on the cross section of the chamber. The insulation at the joint between
The purpose of this research was to improve the present baking oven. The distribution of the air flow in the chamber of the present baking oven is extremely non-uniform on the cross section of the chamber. The insulation at the joint between
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/01431813637868230176