Zobrazeno 1 - 1
of 1
pro vyhledávání: '"林汶潔"'
Autor:
Lin, Wen-Chieh, 林汶潔
104
In this thesis, cycling stress induced trap creation and write disturb failure time degradation mode are investigated by analyzing the carrier transport properties of the leakage current. The results reveal that stress-induced traps will gen
In this thesis, cycling stress induced trap creation and write disturb failure time degradation mode are investigated by analyzing the carrier transport properties of the leakage current. The results reveal that stress-induced traps will gen
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/zxsz26
