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pro vyhledávání: '"林昱澤"'
Autor:
Lin, Yu-Ze, 林昱澤
107
Shared-memory systems enable parallel computing for Automatic Test Pattern Generation (ATPG). Although existing parallel ATPG can reach near-linear speedup, the problem of test inflation becomes a critical issue to its practicality. This the
Shared-memory systems enable parallel computing for Automatic Test Pattern Generation (ATPG). Although existing parallel ATPG can reach near-linear speedup, the problem of test inflation becomes a critical issue to its practicality. This the
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/5h6g77
