Zobrazeno 1 - 2
of 2
pro vyhledávání: '"杜华 Du Hua"'
Publikováno v:
Optics and Precision Engineering. 20:796-802
For characterizing the nanostructure and controlling nano-manufacturing quality,a metrological Atomic Force Microscope(AFM) was designed and constructed in National Institute of Metrology.To trace the displacement to the SI unit,the relative position
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b2b3b5466fd1c71579de057d4abb0ec5
https://doi.org/10.3788/ope.20122004.0796
https://doi.org/10.3788/ope.20122004.0796
Publikováno v:
Infrared and Laser Engineering. 47:817005
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a03faee663e9c8a0ca737366f2f84d2e
https://doi.org/10.3788/irla201847.0817005
https://doi.org/10.3788/irla201847.0817005