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pro vyhledávání: '"李嶸雲"'
Autor:
Jung-Yun Lee, 李嶸雲
95
This thesis analyzes a number of TFT-LCD source driver IC test programs of major TFT-LCD driver IC designers and raises the test throughput by means of both test time reduction and test yield increasing. We also use object oriented programmin
This thesis analyzes a number of TFT-LCD source driver IC test programs of major TFT-LCD driver IC designers and raises the test throughput by means of both test time reduction and test yield increasing. We also use object oriented programmin
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/56538579465508719835