Zobrazeno 1 - 3
of 3
pro vyhledávání: '"李博闻"'
Publikováno v:
Chinese Journal of Reparative & Reconstructive Surgery; 2024, Vol. 38 Issue 11, p1414-1420, 7p
Autor:
Lee, Bowen, 李博聞
107
In this paper, the thickness of the oxide layer of silicon on insulator samples was measured using ellipsometry. Because the silicon on insulator samples were highly doped the experimented data were hard to fit using theoretical fitting. In
In this paper, the thickness of the oxide layer of silicon on insulator samples was measured using ellipsometry. Because the silicon on insulator samples were highly doped the experimented data were hard to fit using theoretical fitting. In
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/83rbx6
Publikováno v:
Journal of Engineering Geology / Gongcheng Dizhi Xuebao; 2021, Vol. 29 Issue 6, p1676-1691, 16p