Zobrazeno 1 - 1
of 1
pro vyhledávání: '"方新傑"'
Autor:
Hsin-Chieh Fang, 方新傑
102
The study develops the uniform temperature of handler chamber for the IC (integrated circuits) testing system. The region temperature far away from the heat point in the original IC testing chamber is much lower, and the temperature differen
The study develops the uniform temperature of handler chamber for the IC (integrated circuits) testing system. The region temperature far away from the heat point in the original IC testing chamber is much lower, and the temperature differen
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/25243110748062729429
