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pro vyhledávání: '"彭依涵"'
Autor:
Yi-han Peng, 彭依涵
103
As the feature size of the semiconductor technology keeps scaling down, more and more transistors are integrated to a single chip. However, this also increases the susceptibility of chips to manufacturing defects as well as external disturba
As the feature size of the semiconductor technology keeps scaling down, more and more transistors are integrated to a single chip. However, this also increases the susceptibility of chips to manufacturing defects as well as external disturba
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/pzkxyp
