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pro vyhledávání: '"张光沉 Zhang Guang-chen"'
Publikováno v:
Chinese Journal of Luminescence. 32:1046-1050
Accelerated aging test at the temperature of 85 ℃ were carried out on high-power GaN-based white light-emitting diodes.The degradation of main performance parameters was investigated.After 6 500 h,the luminous flux rate of the samples was declined
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8b8b3b7fd8e90b65c117102bdfd35863
https://doi.org/10.3788/fgxb20113210.1046
https://doi.org/10.3788/fgxb20113210.1046
