Zobrazeno 1 - 7
of 7
pro vyhledávání: '"张伟军"'
Publikováno v:
Journal of Environmental & Occupational Medicine; 2022, Vol. 39 Issue 6, p690-694, 5p
Publikováno v:
Journal of Engineering Management / Gongcheng Guanli Xuebao; Oct2020, Vol. 34 Issue 5, p25-30, 6p
Autor:
CHANG,WEI-CHUN, 張偉軍
104
In recent years, many studies have indirectly use gross moist stability (Yu 1997) to analyze climatic phenomena (e.g., Madden-Julian Oscillation, MJO). The gross moist stability is determined by atmospheric most static energy profile associa
In recent years, many studies have indirectly use gross moist stability (Yu 1997) to analyze climatic phenomena (e.g., Madden-Julian Oscillation, MJO). The gross moist stability is determined by atmospheric most static energy profile associa
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/58277687325451286508
Autor:
Chang, Wei-Chun, 張偉軍
99
This research developed an innovative droplet microfluidic platform, which is a simple-designed 3-D cross-overlapping microchannel capable of manipulating the fission and fusion of droplets. Numerical simulation and experiments both verified
This research developed an innovative droplet microfluidic platform, which is a simple-designed 3-D cross-overlapping microchannel capable of manipulating the fission and fusion of droplets. Numerical simulation and experiments both verified
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/62684157459711117394
Publikováno v:
Journal of Harbin Institute of Technology. Social Sciences Edition / Haerbin Gongye Daxue Xuebao. Shehui Kexue Ban; Feb2017, Vol. 49 Issue 2, p100-108, 9p
Autor:
張偉軍
93
In order to reduce costs and increase the yields of wafer device, chip manufacturers are using wafers with ever-larger diameters and ever-narrower line widths, which has led to a demand for ever-lower levels of trace-element contamination in
In order to reduce costs and increase the yields of wafer device, chip manufacturers are using wafers with ever-larger diameters and ever-narrower line widths, which has led to a demand for ever-lower levels of trace-element contamination in
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/02806989908534721939
Publikováno v:
Journal of Harbin Institute of Technology. Social Sciences Edition / Haerbin Gongye Daxue Xuebao. Shehui Kexue Ban; feb2016, Vol. 48 Issue 2, p100-108, 9p