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pro vyhledávání: '"孫國瑋"'
Autor:
Guo-wei Sun, 孫國瑋
106
Differential item functioning (DIF) analyses are important in terms of test fairness and test validaity. As Zumbo (2007) states, “Third Generation DIF” is best characterized by a subtle but extremely important change in how we think of D
Differential item functioning (DIF) analyses are important in terms of test fairness and test validaity. As Zumbo (2007) states, “Third Generation DIF” is best characterized by a subtle but extremely important change in how we think of D
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/sfwkg9
Autor:
Sun Guo Wei, 孫國瑋
98
It was found the Type I error rate of differential item functioning（DIF） assessment was seriously influenced by the percentage of DIF items in the test. To diminish this problem, the DIF-free-then-DIF（DFTD）strategy was strongly recomm
It was found the Type I error rate of differential item functioning（DIF） assessment was seriously influenced by the percentage of DIF items in the test. To diminish this problem, the DIF-free-then-DIF（DFTD）strategy was strongly recomm
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/41528077196051440592