Zobrazeno 1 - 2
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pro vyhledávání: '"周哲 Zhou Zhe"'
Publikováno v:
Optics and Precision Engineering. 23:1714-1721
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a5401cd2bc8b390a814d4a15ea5d6afc
https://doi.org/10.3788/ope.20152306.1714
https://doi.org/10.3788/ope.20152306.1714
Autor:
周哲 Zhou Zhe
Publikováno v:
Chinese Journal of Liquid Crystals and Displays. 27:649-652
Horizontal Line Mura is one kind of defect during TFT-LCD manufacturing process.This defect will affect display quality seriously.After analyzing the profile of the metal layer and measuring the stress status of metal film,the root cause can be revea
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::84d3d9a93d35393a0d7ab33c5fac08a7
https://doi.org/10.3788/yjyxs20122705.0649
https://doi.org/10.3788/yjyxs20122705.0649