Zobrazeno 1 - 2
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pro vyhledávání: '"卢明臻 Lu Ming-zhen"'
Publikováno v:
Optics and Precision Engineering. 22:2399-2405
Publikováno v:
Optics and Precision Engineering. 20:796-802
For characterizing the nanostructure and controlling nano-manufacturing quality,a metrological Atomic Force Microscope(AFM) was designed and constructed in National Institute of Metrology.To trace the displacement to the SI unit,the relative position