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pro vyhledávání: '"劉秉融"'
Autor:
Ping-Jung Liu, 劉秉融
99
In the progress of the electronics industry, the scale down of conventional metal oxide semiconductor thin film transistor (MOSFET) will emerge some reliability problems, such as short-channel effect, hot- carrier effect and drain-induce barr
In the progress of the electronics industry, the scale down of conventional metal oxide semiconductor thin film transistor (MOSFET) will emerge some reliability problems, such as short-channel effect, hot- carrier effect and drain-induce barr
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/4awym3
