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The dielectric characteristics of layer structured bismuth material SrBi2Ta1.8V0.2O9 have been well developed. SrBi2Ta1.8V0.2O9 ceramic was used as the target material and SrBi2Ta1.8V0.2O9 thin film was deposited on ITO glass substrate by R.F
The dielectric characteristics of layer structured bismuth material SrBi2Ta1.8V0.2O9 have been well developed. SrBi2Ta1.8V0.2O9 ceramic was used as the target material and SrBi2Ta1.8V0.2O9 thin film was deposited on ITO glass substrate by R.F
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/49998636880097292944
Publikováno v:
Journal of China Medical University; 2019, Vol. 48 Issue 10, p915-925, 5p
Publikováno v:
Journal of Pharmaceutical Practice & Service; Nov2017, Vol. 35 Issue 6, p499-503, 5p
Publikováno v:
Journal of Pharmaceutical Practice & Service; Jan2017, Vol. 35 Issue 1, p1-16, 5p