Zobrazeno 1 - 10
of 10
pro vyhledávání: '"乐建"'
Publikováno v:
Chinese Journal of Inorganic Analytical Chemistry / Zhongguo Wuji Fenxi Huaxue; Jan2024, Vol. 14 Issue 1, p112-116, 5p
Publikováno v:
Hydrogeology & Engineering Geology / Shuiwendizhi Gongchengdizhi; May2023, Vol. 50 Issue 3, p104-114, 11p
Autor:
LEJian-lian(乐建连), ZHANGZhuan(章专)
Publikováno v:
Zhejiang Daxue xuebao. Lixue ban, Vol 32, Iss 2, Pp 183-185 (2005)
在分析发射极耦合逻辑(ECL)电路的互补对偶特性基础上，指出了差分对的两个开关变量的不独立性及互补对偶特性，并设计了互补对偶结构的ECL三值D型锁存器.这种新型的D型锁存器电路比传
Externí odkaz:
https://doaj.org/article/46c44b56612945b39b90ab7e03967b59
Publikováno v:
Research & Exploration in Laboratory. Dec2016, Vol. 35 Issue 12, p96-99. 4p.
Publikováno v:
Petroleum Geology & Recovery Efficiency; 2021, Vol. 28 Issue 2, p10-17, 8p
Publikováno v:
Rare Metal Materials & Engineering; Mar2020, Vol. 49 Issue 3, p901-906, 6p
Publikováno v:
Journal of Nanjing Agricultural University / Nanjuing Nongye Daxue Xuebao; 2019, Vol. 42 Issue 4, p729-733, 5p
Publikováno v:
Research & Exploration in Laboratory; Jul2017, Vol. 36 Issue 7, p189-234, 4p
Autor:
Chien-To Yueh, 樂建鐸
93
IT industry is the most important economical anchor of our country for recent decades. As we can see, various social developments such as business types, life styles evolve from the growth of IT changes. For example, semiconductor industry op
IT industry is the most important economical anchor of our country for recent decades. As we can see, various social developments such as business types, life styles evolve from the growth of IT changes. For example, semiconductor industry op
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/72244486401758738370
Autor:
Chien-Tung Yuen, 樂建東
90
In this thesis, the study of flicker noise in MOSFETs is applied in order to evaluate the impact of scaling transistors representative of technologies with minimum channel length scaled from 0.18 m down to 0.1um. The dependences on bias and t
In this thesis, the study of flicker noise in MOSFETs is applied in order to evaluate the impact of scaling transistors representative of technologies with minimum channel length scaled from 0.18 m down to 0.1um. The dependences on bias and t
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/38993612249681379406