Zobrazeno 1 - 2
of 2
pro vyhledávání: '"спектральна елiпсометрiя"'
Publikováno v:
Ukrainian Journal of Physics; Vol. 66 No. 10 (2021); 885
Український фізичний журнал; Том 66 № 10 (2021); 885
Український фізичний журнал; Том 66 № 10 (2021); 885
The (Ga0.3In0.7)2Se3 films deposited by the thermal evaporation technique are annealed in the inert atmosphere (argon) for 1 h at temperatures of 50, 100, and 150 ∘C. The spectral ellipsometry is applied for measuring the spectral dependences of th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=issn20710194::2f2c6d51c71f09f2678b6df9ac68cc77
https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2021041
https://ujp.bitp.kiev.ua/index.php/ujp/article/view/2021041
Autor:
Pop, M.M., Bilanych, V.S., Komanicky, V., Nebola, I.I., Solomon, A.M., Kopčanský, P., Studenyak, I.P.
Publikováno v:
Ukrainian Journal of Physics; Vol. 67 No. 9 (2022); 684
Український фізичний журнал; Том 67 № 9 (2022); 684
Український фізичний журнал; Том 67 № 9 (2022); 684
(GaxIn1-x)2Se3 films with 0.1 ≤ x ≤ 0.4 were deposited by the thermal evaporation technique. As-deposited (GaxIn1-x)2Se3 films were irradiated using the wideband radiation of a Cu-anode X-ray tube at different exposure times. The spectral depende
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::98378c7084e2d6ba7a9bbf6cb4e60a5f
https://doi.org/10.15407/ujpe67.9.684
https://doi.org/10.15407/ujpe67.9.684