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pro vyhledávání: '"рост многослойных рентгеновских зеркал (МРЗ) WC/Si"'
Autor:
Pershyn, Yuriy P., Chumak, V. S., Shypkova, I. G., Mamon, Valentine V., Devizenko, A. Yu., Kondratenko, Valeriy V., Reshetnyak, M. V., Zubarev, Evgeniy N.
WC/Si multilayer X-ray mirrors (MXMs) with nominal layers thicknesses of 0.2…30.3 nm (periods: 0.7…38.9 nm) were deposited by direct current magnetron sputtering and studied by X-ray diffraction and crosssectional transmission electron microscopy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3033::9698adbe9e41c25c6508c3d53c981220
http://repository.kpi.kharkov.ua/handle/KhPI-Press/58680
http://repository.kpi.kharkov.ua/handle/KhPI-Press/58680
