Zobrazeno 1 - 1
of 1
pro vyhledávání: '"показатель «подлинность»"'
Publikováno v:
Ведомости Научного центра экспертизы средств медицинского применения, Vol 0, Iss 2, Pp 13-16 (2018)
Method of X-ray phase analysis based on obtaining and analyzing the diffraction pattern resulting from the diffraction of x-rays scattered by electrons of the atoms of the irradiated polycrystalline sample. Using this method in the framework of a pre
Externí odkaz:
https://doaj.org/article/e90cab8eb1c444e889b4e70567726db3
