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Publikováno v:
Труды Института системного программирования РАН, Vol 29, Iss 4, Pp 247-256 (2018)
Hardware testing is a process aimed at detecting manufacturing faults in integrated circuits. To measure test quality, two main metrics are in use: fault detection abilities (fault coverage) and test application time (test length). Many algorithms ha
Externí odkaz:
https://doaj.org/article/ae31f53688d8405d8aa9f9eb5848aa0d
Publikováno v:
Труды Института системного программирования РАН, Vol 29, Iss 4, Pp 247-256 (2018)
Hardware testing is a process aimed at detecting manufacturing faults in integrated circuits. To measure test quality, two main metrics are in use: fault detection abilities (fault coverage) and test application time (test length). Many algorithms ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d45509f886515383a8d3ce7c1ca9d50e
https://doi.org/10.15514/ispras-2017-29(4)-16
https://doi.org/10.15514/ispras-2017-29(4)-16