Zobrazeno 1 - 10
of 247
pro vyhledávání: '"Á. Nemcsics"'
Autor:
Csik, A., Serenyi, M., Erdelyi, Z., Nemcsics, A., Cserhati, C., Langer, G. A., Beke, D. L., Frigeri, C., Simon, A.
Thermal stability of hydrogenated amorphous Si/Ge multilayers has been investigated by Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Small-Angle X-Ray Diffraction (SAXRD) techniques. Amorphous H-Si/Ge multilayers were
Externí odkaz:
http://arxiv.org/abs/0902.1674
Autor:
Nemcsics, Ákos, Pődör, Bálint, Tóth, Lajos, Balázs, János, Dobos, László, Makai, János, Csutorás, Márton, Ürmös, Antal
Publikováno v:
In Microelectronics Reliability April 2016 59:60-63
Publikováno v:
In Journal of Crystal Growth 2011 335(1):58-61
Autor:
Nemcsics, Á., Tóth, L., Dobos, L., Heyn, Ch., Stemmann, A., Schramm, A., Welsch, H., Hansen, W.
Publikováno v:
In Superlattices and Microstructures 2010 48(4):351-357
Publikováno v:
In Materials Science & Engineering B 2009 165(1):118-121
Publikováno v:
In Vacuum 2009 84(1):152-154
Publikováno v:
In Solar Energy Materials and Solar Cells 2005 89(2):175-183